Microscope with instrumentation
The Laboratory is equipped with a JEOL JEM-ARM200F NEOARMex microscope designed to work in TEM, STEM and 4D-STEM modes. The microscope is dedicated to high-resolution chemical observations and chemical analyses on the micro-, nano- and atomic scales, as well as in-situ environmental research in liquids and at cryogenic temperatures. The magnification range of microscopic images in TEM is from 50x to 1500000x.
The microscope is equipped with:
- cold field emission gun
- spherical aberration (Cs) corrector
- high angle annular dark field detector (HAADF)
- selected area all field detector (SAAF), dedicated to annular bright field (ABF), optimum bright field (OBF) and differential phase-contrast (DPC) methods
- energy dispersive X-ray spectrometer (EDS) - Dual Silicon Drift Detector JEOL Centurio XXXL
- 4D-STEM Gatan 4D STEMx system with the ability to acquire and analyze data in the 4D-STEM technique and perform studies such as deformation maps, crystallographic orientation maps, creation of virtual apertures and differential phase contrast
- highly sensitive and fast Gatan METRO camera for direct electron detection (DED)
- double tilt liquid nitrogen cryo-transfer holder model 915 of Gatan for observations and EDS analyses at cryogenic temperatures
- Poseidon Select in-situ TEM liquid cell holder, for observations in a liquid environment/liquid state and examining chemical, electrochemical and structural processes occurring in real-time and on the nanoscale
The laboratory is also equipped with a JEOL EC-52000IC ion cleaner, a precision ion polishing system PIPS II Gatan (with a sample cooling table) and auxiliary equipment for sample preparation.
